Visit us at these upcoming events!

Global Semiconductor Forum

CS Mantech 2016 Miami

The ConFab 2016

Semicon West 2016

|Defect Library|

Reticle Tilt Defect

Spin Defect – Line

Spin Defect – Entire Wafer

Spin Defect on Edge

Center Spin Macro Defect

Scratches By Machine

Scratches By Human

Rework – Yield Improvement

Rework – Scrap Avoidance

Previous Layer Defects

Partial Pattern – No Expose

Poly Haze Macro Defect

Particle Defects

Missing Patterns

Lens Stepper Macro Defects

Wafer Hotspot Defects

First 12 Wafers – Different

Flashfield Defects

Wafer Edge Discoloration

Developer Related Defects

EBR Drip Defect

Wafer Contamination – Small

Wafer Contamination – Large

CMP – Macro Defects

Edge Chips – Macro Defects

Poor Rinse – Macro Defect

Blocked Etch Macro Defect

Backside Contamination

2 Chamber Macro Defect

Arcing Defects

3 Chamber Macro Defect

Microtronic’s EAGLEviewIV Chosen as Finalist in “Best of West” Product Awards Program by Solid State Technology and SEMI at SEMICON West 2014

Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System

Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development

Microtronic Unveils New Generation EAGLEview Macro Defect Inspection System at Semicon West 2012

Microtronic EAGLEview Automated Macro Defect Inspection Solution Enables Innovation For Semiconductor Clients

Texas Instruments Recognizes Microtronic as 2006 Supplier Excellence Award Winner