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Wafer Edge Discoloration
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Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Wafer Edge Discoloration
Wafer Edge Discoloration
Above is an example of a semiconductor wafer macro defect detected near the edge of wafer identified as discoloration.
EAGLEview detects a variety of macro defects near the edge of the semiconductor wafer including discoloration.
Download Microtronic Macro Defect Brochure
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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