Microtronic, Inc. Contact Us: 1-877-642-7687 | 1-508-627-8951 [email protected]
Contact Us Today
Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Microtronic, Inc. Contact Us: 1-877-642-7687 | 1-508-627-8951 [email protected]
Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT Semiconductor Wafer Microscope Inspection System
MicroINSPECT Automated Semiconductor Wafer Inspection System Running SITEview Software
Advanced Robotics, Microscopes with SITEview Software Automate Micro or Macro Defect Inspection
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
SITEview Software automates all microscope functions, metrology routines, and a wide variety of operations that make the wafer defect inspection process quicker and more accurate while minimizing operator errors.
MicroINSPECT 300 FA Failure Analysis Automated Semiconductor Wafer Inspection
MicroINSPECT Semiconductor Wafer Defect Inspection System
MicroINSPECT system automates sophisticated semiconductor wafer inspection – micro or macro – for semiconductor wafers ranging in size from 50 mm to 450 mm. The MicroINSPECT wafer inspection system couples a state-of-the-art robotics semiconductor wafer handler with a Zeiss Axiotron 2 inspection microscope or any other major brand inspection microscope of your choosing, together with the Microtronic SITEview software.
Our innovative configuration provides a simple to operate, yet powerful enough, defect inspection tool for even the most advanced microscopist.
SITEview Software Automates Microscope & Optical Inspection Functions
SITEview inspection recipes are modular ASCII files which may be created off-line or interactively on-line. Recipes may be created at a semiconductor die, field, or wafer level. SITEview allows automated microscope functions, metrology routines, and calls to the internal SITEview command set to run at each inspection site. During wafer inspection, operators may add, move, or update inspection sites for identifying repetitive defects. Defect codes, comments, measurement results, and images are stored in the data file. For simple manual inspection, a user may click on a semiconductor wafer slot icon and select ‘micro inspection’ to automatically place the wafer correctly on the stage. After visual inspection, the semiconductor wafer is returned by pressing the ‘store wafer’ button or any empty slot.
When integrated with an OCR reader, SITEview speeds semiconductor wafer throughput by combining wafer inspection and wafer sorting in one operation without loss of time during wafer inspection. Sort routines may be appended to the end of an inspection recipe.
MicroINSPECT Semiconductor Wafer Inspection System Key Features
Custom Configurations of MicroINSPECT Semiconductor Wafer Defect Inspection System Include:
SITEview Software Applications for MicroINSPECT
Advanced Robotics
Contact us today for a demonstration of Microtronic’s MicroINSPECT Microscope Wafer Inspection or any of our other semiconductor wafer defect inspection systems.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
Navigation
Social connect