mineene | Microtronic Inc

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So far mineene has created 42 blog entries.

17 July 17, 2020

Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment

4 December 4, 2018

Microtronic Announces New Informational Tech Bulletin Series on Optimizing Semiconductor Macro Defect Wafer Inspection

13 July 13, 2017

Bridging the Macro and Micro World of Defects

13 July 13, 2017

Solid State Technology and SEMI Announce the 2017 Best of West Award Winner

8 July 8, 2017

SEMI and Solid State Technology Announce 2017 “Best of West” Award Finalists

31 December 31, 2015

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Gallery
Reticle Tilt Defect

Defect Library

Reticle Tilt Defect

31 December 31, 2015

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Spin Defect – Line

Defect Library

Spin Defect – Line

31 December 31, 2015

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Spin Defect – Entire Wafer

Defect Library

Spin Defect – Entire Wafer

31 December 31, 2015

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Spin Defect on Edge

Defect Library

Spin Defect on Edge

31 December 31, 2015

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Center Spin Macro Defect

Defect Library

Center Spin Macro Defect

31 December 31, 2015

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Scratches By Machine

Defect Library

Scratches By Machine

31 December 31, 2015

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Scratches By Human

Defect Library

Scratches By Human

31 December 31, 2015

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Rework – Yield Improvement

Defect Library

Rework – Yield Improvement

31 December 31, 2015

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Rework – Scrap Avoidance

Defect Library

Rework – Scrap Avoidance

31 December 31, 2015

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Previous Layer Defects

Defect Library

Previous Layer Defects

31 December 31, 2015

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Partial Pattern – No Expose

Defect Library

Partial Pattern – No Expose

31 December 31, 2015

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Poly Haze Macro Defect

Defect Library

Poly Haze Macro Defect

31 December 31, 2015

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Particle Defects

Defect Library

Particle Defects

31 December 31, 2015

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Missing Patterns

Defect Library

Missing Patterns

31 December 31, 2015

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Lens Stepper Macro Defects

Defect Library

Lens Stepper Macro Defects

31 December 31, 2015

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Wafer Hotspot Defects

Defect Library

Wafer Hotspot Defects

31 December 31, 2015

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First 12 Wafers – Different

Defect Library

First 12 Wafers – Different

31 December 31, 2015

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Flashfield Defects

Defect Library

Flashfield Defects

31 December 31, 2015

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Wafer Edge Discoloration

Defect Library

Wafer Edge Discoloration

31 December 31, 2015

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Developer Related Defects

Defect Library

Developer Related Defects

31 December 31, 2015

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EBR Drip Defect

Defect Library

EBR Drip Defect

31 December 31, 2015

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Wafer Contamination – Small

Defect Library

Wafer Contamination – Small

31 December 31, 2015

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Wafer Contamination – Large

Defect Library

Wafer Contamination – Large

31 December 31, 2015

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CMP – Macro Defects

Defect Library

CMP – Macro Defects

31 December 31, 2015

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Edge Chips – Macro Defects

Defect Library

Edge Chips – Macro Defects

31 December 31, 2015

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Poor Rinse – Macro Defect

Defect Library

Poor Rinse – Macro Defect

31 December 31, 2015

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Blocked Etch Macro Defect

Defect Library

Blocked Etch Macro Defect

31 December 31, 2015

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Gallery
Backside Contamination

Defect Library

Backside Contamination

7 December 7, 2015

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2 Chamber Macro Defect

Defect Library

2 Chamber Macro Defect

7 December 7, 2015

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Gallery
Arcing Defects

Defect Library

Arcing Defects

7 December 7, 2015

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Gallery
3 Chamber Macro Defect

Defect Library

3 Chamber Macro Defect

5 July 5, 2014

Microtronic’s EAGLEviewIV Chosen as Finalist in “Best of West” Product Awards Program by Solid State Technology and SEMI at SEMICON West 2014

10 July 10, 2013

Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System

30 May 30, 2013

Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development

9 July 9, 2012

Microtronic Unveils New Generation EAGLEview Macro Defect Inspection System at Semicon West 2012

25 August 25, 2011

Microtronic EAGLEview Automated Macro Defect Inspection Solution Enables Innovation For Semiconductor Clients

7 April 7, 2007

Texas Instruments Recognizes Microtronic as 2006 Supplier Excellence Award Winner

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