Microtronic Semiconductor Wafer Defect Inspection Innovations
Microtronic Wafer Defect Inspection Highlights

1994 – Microtronic Founded
1995 – MicroINSPECT™ & SITEview™ Launched
1997 – MicroSORT™ Launched
1998 – Florida R&D Center Established
2000-01 – Lucent Worldwide Supplier of the Year Award
2001 – NY Operations & R&D Center
2002 – EagleView™ Launched
2004 – ProcessVIEW™ Launched
2006 – Texas Instruments Global Supplier Excellence Award
2008 – EagleView™ Edge Chip Detection
2009 – ProcessGUARD™ Launched
2011 – EagleView™ Weigh Cell Option
2013 – EagleView™ ProcessGuard Software Release
2014 – EagleView™ IV
2017 – EagleView™ V Awarded Best of West Winner at Semicon West