Microtronic Semiconductor Wafer Defect Inspection Innovations

Microtronic Wafer Defect Inspection Highlights

Microtronic - Semiconductor Wafer Inspection Systems

  • 1994 – Microtronic Founded

  • 1995 – MicroINSPECT™ & SITEview™ Launched

  • 1997 – MicroSORT™ Launched

  • 1998 – Florida R&D Center Established

  • 2000-01 – Lucent Worldwide Supplier of the Year Award

  • 2001 – NY Operations & R&D Center

  • 2002 – EagleView™ Launched

  • 2004 – ProcessVIEW™ Launched

  • 2006 – Texas Instruments Global Supplier Excellence Award

  • 2008 – EagleView™ Edge Chip Detection

  • 2009 – ProcessGUARD™ Launched

  • 2011 – EagleView™ Weigh Cell Option

  • 2013 – EagleView™ ProcessGuard Software Release

  • 2014 – EagleView™ IV

  • 2017 – EagleView™ V Awarded Best of West Winner at Semicon West