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Misc
27
November 27, 2012
Class aptent taciti sociosqu ad litora torquent per conubia nostra pers.
Errol Akomer
2012-11-27T14:42:55+00:00
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
Wafer Hotspot Defects
First 12 Wafers – Different
Flashfield Defects
Wafer Edge Discoloration
Developer Related Defects
EBR Drip Defect
Wafer Contamination – Small
Wafer Contamination – Large
CMP – Macro Defects
Edge Chips – Macro Defects
Poor Rinse – Macro Defect
Blocked Etch Macro Defect
Backside Contamination
2 Chamber Macro Defect
Arcing Defects
3 Chamber Macro Defect
Products
EagleView – Auto Macro Wafer Defect Inspection
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT 300FA – Failure Analysis
MicroSORT – Stand Alone Wafer Sorter
ProcessGUARD – EagleView Desktop Client
Trans-Imager
SITEview Software – Defect Review, Images, and Sorting
Customized Solutions
