Microtronic, Inc.
[email protected]
Company
Company Overview
Innovation Highlights
Technologies
Products
Trans-Imager
SITEview Software – Defect Review, Images, and Sorting
EAGLEview – Automated Macro Wafer Defect Inspection
ProcessGUARD – EAGLEview Desktop Client
MicroSORT – Stand Alone Wafer Sorter
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT 300FA – Failure Analysis
Customized Solutions
Applications
Wafer Randomization Modes
ProcessGuard Xtensis (and Trans-Imager Modules)
Transparent Wafer Imaging
ProcessGuard Defect Library
Excursion Control
Guardbanding Capability
Skipping Manual Inspection
Customized Automatic Sorting
Customized Inspection Recipes
Artificial Intelligence (AI) on CMP Edge Residual and Pin Hole Defects
MicroView (Internal & External Microscope Options)
Technical Bulletins
How to catch more “disappearing” latent defects
Catching More Marginal Wafer Defects
Guardbanding Inline Wafer Defects Improves Chip Reliability
Increasing Semiconductor Device Reliability
Stop intermittent In-line Wafer Defects – Increase Your Yields
Get Better Wafer Inspection with Intelligent Machine Vision
Front And Backside Macro Defect Inspection – One Super-fast Tool
Now You Can Weigh Wafers While Inspecting for Macro Defects
Macro Defect Inspection For Mission-Critical Chips
Videos
Defect Library
News
Contact Us
Company
Company Overview
Innovation Highlights
Technologies
Products
Trans-Imager
SITEview Software – Defect Review, Images, and Sorting
EAGLEview – Automated Macro Wafer Defect Inspection
ProcessGUARD – EAGLEview Desktop Client
MicroSORT – Stand Alone Wafer Sorter
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT 300FA – Failure Analysis
Customized Solutions
Applications
Wafer Randomization Modes
ProcessGuard Xtensis (and Trans-Imager Modules)
Transparent Wafer Imaging
ProcessGuard Defect Library
Excursion Control
Guardbanding Capability
Skipping Manual Inspection
Customized Automatic Sorting
Customized Inspection Recipes
Artificial Intelligence (AI) on CMP Edge Residual and Pin Hole Defects
MicroView (Internal & External Microscope Options)
Technical Bulletins
How to catch more “disappearing” latent defects
Catching More Marginal Wafer Defects
Guardbanding Inline Wafer Defects Improves Chip Reliability
Increasing Semiconductor Device Reliability
Stop intermittent In-line Wafer Defects – Increase Your Yields
Get Better Wafer Inspection with Intelligent Machine Vision
Front And Backside Macro Defect Inspection – One Super-fast Tool
Now You Can Weigh Wafers While Inspecting for Macro Defects
Macro Defect Inspection For Mission-Critical Chips
Videos
Defect Library
News
Contact Us
Particle Defects
Home
Defect Library
Particle Defects
Particle Defects
Particle Defects
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
https://youtu.be/DSluLdjR_-w
Navigation
Company
Products
Applications
Technical Bulletins
Videos
Defect Library
News
Contact Us
Social connect
Particle Defects
Particle Defects
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Navigation
Social connect