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Defect Library
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Microtronic Announces Methodology for Reducing or Eliminating Manual Microscope Inspection during the Post Pandemic Labor Shortage
Karen Wucher
2022-06-23T21:47:15+00:00
Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment
Errol Akomer
2020-07-21T16:42:03+00:00
Microtronic Announces New Informational Tech Bulletin Series on Optimizing Semiconductor Macro Defect Wafer Inspection
Errol Akomer
2018-12-04T03:25:27+00:00
Bridging the Macro and Micro World of Defects
Errol Akomer
2019-01-29T21:28:46+00:00
Solid State Technology and SEMI Announce the 2017 Best of West Award Winner
Errol Akomer
2017-07-13T02:57:06+00:00
SEMI and Solid State Technology Announce 2017 “Best of West” Award Finalists
Errol Akomer
2017-07-11T02:27:45+00:00
Permalink
Gallery
Reticle Tilt Defect
Defect Library
Reticle Tilt Defect
Errol Akomer
2019-01-29T21:40:37+00:00
Permalink
Gallery
Spin Defect – Line
Defect Library
Spin Defect – Line
Errol Akomer
2016-01-02T16:55:12+00:00
Permalink
Gallery
Spin Defect – Entire Wafer
Defect Library
Spin Defect – Entire Wafer
Errol Akomer
2019-01-29T21:53:37+00:00
Permalink
Gallery
Spin Defect on Edge
Defect Library
Spin Defect on Edge
Errol Akomer
2019-01-29T21:58:05+00:00
Permalink
Gallery
Center Spin Macro Defect
Defect Library
Center Spin Macro Defect
Errol Akomer
2019-01-29T21:38:04+00:00
Permalink
Gallery
Scratches By Machine
Defect Library
Scratches By Machine
Errol Akomer
2016-01-02T17:56:28+00:00
Permalink
Gallery
Scratches By Human
Defect Library
Scratches By Human
Errol Akomer
2016-01-02T18:18:14+00:00
Permalink
Gallery
Rework – Yield Improvement
Defect Library
Rework – Yield Improvement
Errol Akomer
2016-01-03T00:53:01+00:00
Permalink
Gallery
Rework – Scrap Avoidance
Defect Library
Rework – Scrap Avoidance
Errol Akomer
2016-01-03T00:59:02+00:00
Permalink
Gallery
Previous Layer Defects
Defect Library
Previous Layer Defects
Errol Akomer
2016-01-03T01:01:14+00:00
Permalink
Gallery
Partial Pattern – No Expose
Defect Library
Partial Pattern – No Expose
Errol Akomer
2016-01-03T01:04:28+00:00
Permalink
Gallery
Poly Haze Macro Defect
Defect Library
Poly Haze Macro Defect
Errol Akomer
2016-01-03T01:07:24+00:00
Permalink
Gallery
Particle Defects
Defect Library
Particle Defects
Errol Akomer
2016-01-03T01:13:27+00:00
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Gallery
Missing Patterns
Defect Library
Missing Patterns
Errol Akomer
2016-01-03T04:00:27+00:00
Permalink
Gallery
Lens Stepper Macro Defects
Defect Library
Lens Stepper Macro Defects
Errol Akomer
2016-01-03T04:04:45+00:00
Permalink
Gallery
Wafer Hotspot Defects
Defect Library
Wafer Hotspot Defects
Errol Akomer
2016-01-03T04:10:02+00:00
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Gallery
First 12 Wafers – Different
Defect Library
First 12 Wafers – Different
Errol Akomer
2016-01-03T04:13:50+00:00
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Gallery
Flashfield Defects
Defect Library
Flashfield Defects
Errol Akomer
2016-01-03T04:25:20+00:00
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Gallery
Wafer Edge Discoloration
Defect Library
Wafer Edge Discoloration
Errol Akomer
2016-01-03T04:35:38+00:00
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Gallery
Developer Related Defects
Defect Library
Developer Related Defects
Errol Akomer
2016-01-03T04:47:49+00:00
Permalink
Gallery
EBR Drip Defect
Defect Library
EBR Drip Defect
Errol Akomer
2016-01-03T04:50:35+00:00
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Gallery
Wafer Contamination – Small
Defect Library
Wafer Contamination – Small
Errol Akomer
2016-01-03T05:00:54+00:00
Permalink
Gallery
Wafer Contamination – Large
Defect Library
Wafer Contamination – Large
Errol Akomer
2016-01-03T05:16:16+00:00
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Gallery
CMP – Macro Defects
Defect Library
CMP – Macro Defects
Errol Akomer
2016-01-03T05:19:49+00:00
Permalink
Gallery
Edge Chips – Macro Defects
Defect Library
Edge Chips – Macro Defects
Errol Akomer
2016-01-03T05:25:15+00:00
Permalink
Gallery
Poor Rinse – Macro Defect
Defect Library
Poor Rinse – Macro Defect
Errol Akomer
2016-01-03T05:29:51+00:00
Permalink
Gallery
Blocked Etch Macro Defect
Defect Library
Blocked Etch Macro Defect
Errol Akomer
2016-01-03T05:33:49+00:00
Permalink
Gallery
Backside Contamination
Defect Library
Backside Contamination
Errol Akomer
2016-01-03T05:37:36+00:00
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Gallery
2 Chamber Macro Defect
Defect Library
2 Chamber Macro Defect
Errol Akomer
2016-01-03T05:46:44+00:00
Permalink
Gallery
Arcing Defects
Defect Library
Arcing Defects
Errol Akomer
2015-12-31T20:00:05+00:00
Permalink
Gallery
3 Chamber Macro Defect
Defect Library
3 Chamber Macro Defect
Errol Akomer
2016-01-03T05:44:45+00:00
Microtronic’s EAGLEviewIV Chosen as Finalist in “Best of West” Product Awards Program by Solid State Technology and SEMI at SEMICON West 2014
Errol Akomer
2017-11-06T21:04:46+00:00
Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System
Errol Akomer
2016-03-06T15:15:11+00:00
Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development
Errol Akomer
2017-11-06T21:05:43+00:00
Microtronic Unveils New Generation EAGLEview Macro Defect Inspection System at Semicon West 2012
Errol Akomer
2017-11-06T21:09:20+00:00
Microtronic EAGLEview Automated Macro Defect Inspection Solution Enables Innovation For Semiconductor Clients
Errol Akomer
2017-11-06T21:10:41+00:00
Texas Instruments Recognizes Microtronic as 2006 Supplier Excellence Award Winner
Errol Akomer
2017-11-06T21:11:42+00:00
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
Wafer Hotspot Defects
First 12 Wafers – Different
Flashfield Defects
Wafer Edge Discoloration
Developer Related Defects
EBR Drip Defect
Wafer Contamination – Small
Wafer Contamination – Large
CMP – Macro Defects
Edge Chips – Macro Defects
Poor Rinse – Macro Defect
Blocked Etch Macro Defect
Backside Contamination
2 Chamber Macro Defect
Arcing Defects
3 Chamber Macro Defect
Products
EagleView – Auto Macro Wafer Defect Inspection
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT 300FA – Failure Analysis
MicroSORT – Stand Alone Wafer Sorter
ProcessGUARD – EagleView Desktop Client
Trans-Imager
SITEview Software – Defect Review, Images, and Sorting
Customized Solutions
