Rework – Yield Improvement

REWORK YIELD IMPROVEMENT - Semiconductor Wafer Macro Defect Image - 1

EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another classification such as, in this case, a scratch.

REWORK YIELD IMPROVEMENT - Semiconductor Wafer Macro Defect Image - 2

An additional example of a semiconductor wafer that has a macro defect that had been detected by EAGLEview and has been also classified as needing rework for yield improvement purposes.