Microtronic Semiconductor Wafer Defect Inspection Equipment Applications

Microtronic Wafer Inspection Solutions are able to Address the Most Demanding Requirements of Semiconductor Manufacturers, IDMs, and Foundries

Microtronic Semiconductor Wafer Defect Inspection Applications

Microtronic provides a wide variety of high performance semiconductor wafer defect inspection, sorting, and metrology equipment, along with solutions and services that increase yields, improve production quality, and lower costs. Below is a summary of some of our general applications.

Our Applications Include:

  • Semiconductor Wafer Defect Inspection Systems, Equipment, Robotics, Software
  • High Throughput Automated Macro Defect Inspection for Semiconductor Wafers
  • Customized Wafer Defect Inspection Equipment
  • Manual Wafer Defect Inspection Solutions
  • Advanced Microscopy Solutions and Microscope Review Stations
  • High Throughput Semiconductor Sorters
  • Software Integration
  • Imaging & Wafer Scanning Software
  • OCR Software