Innovation Highlights

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Microtronic Semiconductor Wafer Defect Inspection Innovations & Highlights

Explore Microtronic’s Innovation Highlights from our inception to industry recognized award winning advances.

1994 – Microtronic Founded
1995 – MicroINSPECT™ & SITEview™ Launched
1997 – MicroSORT™ Launched
1998 – Florida R&D Center Established
2000 – Lucent Worldwide Supplier of the Year Award
2001 – NY Operations & R&D Center
2002 – EAGLEview™ Launched
2004 – ProcessVIEW™ Launched
2006 – Texas Instruments Global Supplier Excellence Award
2008 – EAGLEview™ Edge Chip Detection & Guardbanding
2009 – ProcessGuard™ Launched
2012 – EAGLEview™ Weigh Cell Option
2014 – ProcessGuard™ Defect Markers Launched
2016 – Texas Research Facility Established
2017 – Released EAGLEview 5 and MicroView
2017 – EAGLEview™ 5 Awarded Best of West Winner at Semicon West
2018 – Automatic MicroView Capture and Transparent Wafers
2019 – Deployed Deep Learning AI-based ADC
2020 – ProcessGuard Xtensis™ Released
2021 – EAGLEview Replaces Manual Insp During Labor Shortage
2022 – EAGLEview Wafer Backside Inspection
2023 – Released EAGLEview 6 (redesigned imaging system)