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An example of a large contamination macro defect found by EAGLEview on a semiconductor wafer that has an irregular shape.
An additional example of a semiconductor wafer macro defect caused by contamination.
EAGLEview image depicting a large contamination macro defect on the semiconductor wafer.
Large contamination macro defect detected by EAGLEview on semiconductor wafer.
Wafer Contamination – Large
Wafer Contamination – Large
An example of a large contamination macro defect found by EAGLEview on a semiconductor wafer that has an irregular shape.
An additional example of a semiconductor wafer macro defect caused by contamination.
EAGLEview image depicting a large contamination macro defect on the semiconductor wafer.
Large contamination macro defect detected by EAGLEview on semiconductor wafer.
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