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Above is an example of a semiconductor wafer macro defect detected near the edge of wafer identified as discoloration.
EAGLEview detects a variety of macro defects near the edge of the semiconductor wafer including discoloration.
Wafer Edge Discoloration
Wafer Edge Discoloration
Above is an example of a semiconductor wafer macro defect detected near the edge of wafer identified as discoloration.
EAGLEview detects a variety of macro defects near the edge of the semiconductor wafer including discoloration.
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