Wafer Edge Discoloration

EAGLEview image of a semiconductor wafer with a discoloration macro defect on the edge of the wafer
Above is an example of a semiconductor wafer macro defect detected near the edge of wafer identified as discoloration.

Image taken by EAGLEvview of a large discoloration macro defect on the edge of the semiconductor wafer
EAGLEview detects a variety of macro defects near the edge of the semiconductor wafer including discoloration.