Microtronic, Inc.
[email protected]
Company
Technologies
Innovation Highlights
Products
EAGLEview – Automated Macro Wafer Defect Inspection
ProcessGUARD – EAGLEview Desktop Client
SITEview Software – Defect Review, Images, and Sorting
MicroINSPECT – Microscope Wafer Inspection
MicroSORT – Stand Alone Wafer Sorter
MicroINSPECT 300FA – Failure Analysis
Trans-Imager
Customized Solutions
Applications
Wafer Randomization Modes
ProcessGuard Xtensis (and Trans-Imager Modules)
Transparent Wafer Imaging
ProcessGuard Defect Library
Excursion Control
Guardbanding Capability
Skipping Manual Inspection
Customized Automatic Sorting
Customized Inspection Recipes
Artificial Intelligence (AI) on CMP Edge Residual and Pin Hole Defects
MicroView (Internal & External Microscope Options)
Technical Bulletins
How to catch more “disappearing” latent defects before they turn into reliability time bombs
Marginal semiconductor wafer defects can still slip past final electrical testing. Here’s how to catch more of them…
How “guardbanding” of inline wafer defects can improve chip reliability insurance
Increasing Semiconductor Device Reliability Requires Adding More Wafer Inspection – Here’s A Way
Stop the drip-drip-drip of intermittent in-line semiconductor wafer defects – and increase your yield
Operator shortage? Intelligent machine vision can give more and better wafer inspection.
Now: Front And Backside Macro Defect Inspection In One Versatile, Super-Fast Tool
Now You Can Weigh Wafers While Inspecting for Macro Defects
This Macro Defect Inspection System Fills the Special Needs of Mission-Critical Chips
Videos
Defect Library
News
Press Releases
Articles
Events
Contact Us
Company
Technologies
Innovation Highlights
Products
EAGLEview – Automated Macro Wafer Defect Inspection
ProcessGUARD – EAGLEview Desktop Client
SITEview Software – Defect Review, Images, and Sorting
MicroINSPECT – Microscope Wafer Inspection
MicroSORT – Stand Alone Wafer Sorter
MicroINSPECT 300FA – Failure Analysis
Trans-Imager
Customized Solutions
Applications
Wafer Randomization Modes
ProcessGuard Xtensis (and Trans-Imager Modules)
Transparent Wafer Imaging
ProcessGuard Defect Library
Excursion Control
Guardbanding Capability
Skipping Manual Inspection
Customized Automatic Sorting
Customized Inspection Recipes
Artificial Intelligence (AI) on CMP Edge Residual and Pin Hole Defects
MicroView (Internal & External Microscope Options)
Technical Bulletins
How to catch more “disappearing” latent defects before they turn into reliability time bombs
Marginal semiconductor wafer defects can still slip past final electrical testing. Here’s how to catch more of them…
How “guardbanding” of inline wafer defects can improve chip reliability insurance
Increasing Semiconductor Device Reliability Requires Adding More Wafer Inspection – Here’s A Way
Stop the drip-drip-drip of intermittent in-line semiconductor wafer defects – and increase your yield
Operator shortage? Intelligent machine vision can give more and better wafer inspection.
Now: Front And Backside Macro Defect Inspection In One Versatile, Super-Fast Tool
Now You Can Weigh Wafers While Inspecting for Macro Defects
This Macro Defect Inspection System Fills the Special Needs of Mission-Critical Chips
Videos
Defect Library
News
Press Releases
Articles
Events
Contact Us
Press Releases
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Press Releases
Press Releases
Coming Soon
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
https://youtu.be/DSluLdjR_-w
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Press Releases
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Navigation
Social connect