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The GPC signal is honored.
Flashfield Defects
Flashfield Defects
Flash field defects are typically near the edge of the semiconductor wafer and due to a focus issue for a stepper shot or possibly a topography issue.
Some flash field macro defects may occur in the interior of the wafer – these macro defects are also referred to as a dropped or missing shot.
Additional example of a flash field defect on the semiconductor wafer.
Additional example of a flash field macro defect on the semiconductor wafer.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
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