Spin Defect – Entire Wafer

This is a spin or coat macro defect which covers the entire semiconductor wafer. Without rework, this semiconductor wafer will most likely be scrapped. EagleView saves manufacturers time and money by identifying defects quickly — enabling faster corrective action.

Example of a spin defect detected by EagleView due to a spin or coating issue in the semiconductor wafer production process.

Spin or coat problem impacting the entire wafer. Without rework, this wafer will most likely be scrap. EagleView finds macro defects early while there is still time to take corrective action.