Wafer Contamination – Small

EAGLEview detects small contamination defects on the semiconductor wafer instantly. Typically, any small semiconductor wafer defect that is not a scratch or particle might be considered a small contamination macro defect. The image above shows a small contamination semiconductor wafer macro defect magnified 4x.

Example of a small contamination semiconductor wafer macro defect. Image magnified 8x.

An additional example of a semiconductor wafer macro defect caused by small contamination. Image magnified 4x.

An additional example of a semiconductor wafer macro defect picked up by EAGLEview caused by small contamination in the production process. Image magnified 8x.