Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System

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Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System

Microtronic Announces New Software Release for its EAGLEview Auto Macro Defect Inspection System

Microtronic to Introduce Wider Range of Visual Optimization Options for Fabs at SEMICON West 2013

San Francisco, CA – SEMICON West 2013 – July 10, 2013 – Microtronic Inc., a leading US-based manufacturer of automated macro semiconductor wafer inspection systems announced a new release of its ProcessGuard Software that provides enhanced image quality including additional features that make it easier and quicker to identify and classify semiconductor wafer defects.

Microtronic’s EAGLEview automated macro defect inspection system provides semiconductor manufacturers with complete, full wafer, high-resolution color images of 100% of all wafers inspected at throughput speeds of up to about 150 wafers per hour for wafer sizes 50mm to 450mm.

Microtronic will be demonstrating its EAGLEview system together with its latest ProcessGuard Software release with its enhanced visual optimization features at SEMICON West 2013, the flagship event of the global microelectronic’s industry which features over 700 semiconductor related exhibitors. Microtronic will be in booth 940, South Hall, at SEMICON West 2013.

This software release gives operators significant new flexibility and choices when inspecting, reviewing and classifying their semiconductor wafers by providing the industry’s highest quality high-resolution, full wafer color images by utilizing new color equalization solutions as well as a variety of visual optimization technologies all at the click of a mouse.

“This is good news for the semiconductor industry. Microtronic has already produced over 50 million full wafer images with its EAGLEview systems to date and our newest software upgrade represents another significant advancement in automated macro defect inspection which will make identification and classification of defects faster and simpler.” remarked Reiner Fenske, President, Microtronic.

About Microtronic Inc. founded in 1994 is based in Hawthorne, NY and specializes in automating defect detection and management of the defect inspection processes related to semiconductor wafer production. Microtronic, Inc. designs, manufactures and markets automated semiconductor wafer defect inspection systems, semiconductor wafer sorters, metrology equipment and related software. Visit https://www.microtronic.com

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