FOR IMMEDIATE RELEASE

Microtronic Unveils New Generation EAGLEview Macro Defect Inspection System at Semicon West 2012

New EAGLEview Defect Inspection System Includes Faster Automation, Enhanced Guardbanding and Full Wafer Imaging

Hawthorne, NY July 9, 2012 – Microtronic Inc., the US-based semiconductor wafer inspection company that specializes in semiconductor wafer inspection systems, sorters, and automated microscope equipment will showcase its newest EAGLEview auto macro defect inspection system at Semicon West 2012 at San Francisco’s Moscone Center from July 10th to July 14th. Microtronic engineers will be giving complete, hands-on demonstrations of the EAGLEview defect inspection system’s new features and functions at Booth 1341 South Hall.

Semiconductor manufacturers face ever greater challenges to keep costs low and quality high while grappling with the rapid innovation and the ongoing changes within the semiconductor production process. EAGLEview increases productivity by complimenting traditional wafer defect inspection processes as well as adding an additional layer of protection through automation, full wafer imaging and analytical data.

EAGLEview features high speed wafer handling, automatic recipe creation combined with off-line review and analysis for a complete defect inspection solution. Standard features include:

* High speed wafer inspection throughput – up to 150 wph.
* Simultaneous OCR read and randomization
* Self programming recipe generation
* Automatic wafer pass/fail
* Standard format defect review file
* ProcessGuard client application allows remote real time process monitoring
* Statistical Data mining and Pareto for immediate root cause analysis
* Image review allows thumbnail and full wafer image retrieval for up to 2 years in seconds

“We are very pleased to be able to provide a hands-on demonstration at Semicon 2012 of exactly how our EAGLEview macro defect inspection system can save semiconductor manufacturers enormous amounts of time and money by being able to identify defects quicker, improve failure analysis, and augment traditional wafer inspection processes ”, commented by Reiner Fenske, Founder and CEO of Microtronic, Inc.

Founded in 1994, Microtronic Inc. specializes in automating the process of detecting defects in semiconductor wafers that are ultimately used to make packaged computer chips that go into everything from laptops and cell phones to almost every other intelligent device.

About Microtronic, Inc. is a US-based manufacturer headquartered in Hawthorne, NY that designs, manufactures and markets automated semiconductor wafer defect inspection systems, semiconductor wafer sorters, metrology and related software. Visit https://www.microtronic.com

Contact: [email protected]