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Products
EAGLEview Automated Macro Defect Inspection Equipment and Related Software Products for Semiconductor Wafers
Provides Unrivaled Speed, Accuracy and Reliability
EAGLEview Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. These systems have inspected over 100 million semiconductor wafers worldwide. This macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EAGLEview’s automated wafer inspection is always consistent, tireless, reliable, and fast. This solution helps find macro defects while there’s still time to take corrective action.
EAGLEview provides automated macro defect detection, excursion control and wafer randomization delivering consistent and reliable results while seamlessly integrating into your existing semiconductor manufacturing environment.
EAGLEview combines incredible macro defect inspection throughput with state-of-the art software and analytics in an ergonomic, easy-to-use versatile platform. Operators can automatically and quickly inspect semiconductor wafers from 50mm to 450mm at a rate of over 3,000 wafers per day. EAGLEview configures quickly without complicated and time consuming recipe development and recipe maintenance.
Contact us today to learn how Microtronic products such as EAGLEview macro inspection systems can enhance your productivity.
EAGLEview – Automated Macro Wafer Defect Inspection
Automated Macro Defect Inspection Equipment for Semiconductor Wafers EAGLEview Automated Macro Defect Wafer Inspection Equipment and Related Software...
ProcessGUARD – EAGLEview Desktop Client
Microtronic ProcessGuard Semiconductor Wafer Defect Inspection Management Software Automate Your Macro Defect Semiconductor Wafer Inspection Processes and Equipment...
SITEview Software – Defect Review, Images, and Sorting
SITEview Software | Automated Semiconductor Wafer Optical Inspection and Metrology Semiconductor Wafer Defect Review, Image Storage & Retrieval...
MicroINSPECT – Microscope Wafer Inspection
MicroINSPECT Semiconductor Wafer Microscope Inspection System Advanced Robotics, Microscopes with SITEview Software Automate Micro or Macro Defect Inspection...
MicroSORT – Stand Alone Wafer Sorter
MicroSORT Semiconductor Wafer Sorter Systems Semiconductor Wafer Sorter | Semiconductor Wafer Handling Equipment Microtronic MicroSORT Semiconductor Wafer Sorter...
MicroINSPECT 300FA – Failure Analysis
Semiconductor Wafer Inspection Failure Analysis Tool Manufacturer Advanced Robotics, Microscopes with SITEview Software Automate Micro or Macro Defect...
Trans-Imager
Trans-Imager | Translating process images into significant tool-defect reduction Real-time, tool-specific defectivity data Now there is a way...
Customized Solutions
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems Automated Semiconductor Wafer Testing, Defect Inspection, Sorting, and...
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