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SITEview Software – Defect Review, Images, and Sorting
SITEview Software | Automated Semiconductor Wafer Optical Inspection and Metrology
Semiconductor Wafer Defect Review, Image Storage & Retrieval and Sorting Software
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
Contact us today for a demonstration of SiteVIEW or any of our other semiconductor wafer defect inspection systems.
Microtronic’s SITEview Semiconductor Wafer Defect Inspection Software
SITEview Software | Semiconductor Wafer Defect Review, Wafer Image Storage and Retrieval and Wafer Sorting
Microtronic SITEview System Software is a true user-oriented package. SITEview uses single screen operations to minimize screen clutter and the ability to custom design the end-user screen appearance, control features, and functions. SITEview also incorporates advanced security features and policies including multi-level password protection to facilitate safe sharing of information.
SITEview uses one software version independent of the system configuration. This single package controls the robot, motorized or manual stage, aligner, tilt and wobble macro, backside macro, tilt-back cassette towers, integrated cassette wafer aligners, fixed or handheld bar code reader, wafer OCR, cameras, imaging systems, pattern recognition, and inspection microscopes.
Microtronic SITEview Semiconductor Wafer Sorter Software
SITEview Software Features:
Contact us today for a demonstration of Microtronic’s SITEview Software – Defect Review, Images, and Sorting or any of our other semiconductor wafer defect inspection systems.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
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