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Rework – Scrap Avoidance
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Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Rework – Scrap Avoidance
Rework – Scrap Avoidance
EAGLEview can identify semiconductor wafers that require rework to enhance your scrap avoidance. Above is an example of a wafer that was reworked after being classified by EAGLEview.
Another example of a semiconductor wafer that was identified by EAGLEview as needing to be reworked.
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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