Spin Defect – Entire Wafer

Semiconductor Wafer  Macro Spin Defect

This is a spin or coat macro defect which covers the entire wafer. Without rework, this semiconductor wafer will most likely be scrapped. EAGLEview saves manufactures time and money by identifying defects quickly and enabling faster corrective action.

Semiconductor Wafer Macro Spin Defect

Example of a spin defect detected by EAGLEview due to a spin or coating issue in the production semiconductor wafer process.

SPIN - Semiconductor Wafer Macro Defect Image - 3

Spin or coat problem impacting the entire wafer. Without rework, this wafer will most likely be scrap. EAGLEview identifies macro defects quickly and clearly to help save fabs time and money.