Scratches By Machine Here is an example of a scratch on a 200mm semiconductor wafer that was made...

Scratches By Human Example of semiconductor wafer macro defect that is a scratch made by a person as...

Rework – Yield Improvement EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to...

Rework – Scrap Avoidance EAGLEview can identify semiconductor wafers that require rework to enhance your scrap avoidance. Above...

Previous Layer Defects EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another...

Partial Pattern – No Expose

Poly Haze Macro Defect A poly haze macro defect appearing on a semiconductor wafer is caused by a...

Particle Defects    

Missing Patterns Missing pattern wafers can sometimes be seen in the thumbnail images that are generated in the...

Lens Stepper Macro Defects   A lens stepper macro defect may look similar to a reticle tilt caused...