Wafer Hotspot Defects A hotspot macro defect is a localized area that is out of focus and may...

First 12 Wafers – Different Occasionally half of the semiconductor wafers in a lot that are inspected are...

Wafer Edge Discoloration EAGLEview image of a semiconductor wafer with a discoloration macro defect on the edge of...

Developer Related Defects Semiconductor wafer macro defect caused by poor develop or a poor rinse during the wafer...

EBR Drip Defect EBR drip, sometimes called the “eyelash” semiconductor wafer macro defect, may occur at a very...

Wafer Contamination – Small EAGLEview detects small contamination defects on the semiconductor wafer instantly. Typically, any small semiconductor...

Wafer Contamination – Large An example of a large contamination macro defect found by EAGLEview on a semiconductor...

CMP – Macro Defects Several examples of CMP related macro defects detected during an EAGLEview inspection run There...

Edge Chips – Macro Defects Above is an example of a semiconductor wafer edge chip defect detected by...